CALL FOR PAPER

The 2009 International Conference on Optical Instrument and Technology (OIT’09) is the second event following the OIT’08 and it is sponsored corporately by SPIE, CIS and COS. OIT’09 is a professional conference which takes instrument and related technology as its core. To promote the integration of science with technology in instrumentation fields, the conference is combined with the exhibition of “The 20th Fair for Measurement Instrumentation and Automation (MICONEX)”. It can be expected that OIT’09 will promote the continuous development of optoelectronic technology & instrument knowledge and stimulate new energy to the industry.

Scientific instrument is an indispensable branch and plays more and more important roles in developing national economy, also in the fields of scientific research. Optoelectronic instrument and technology is the essential component of scientific instrument. It has its outstanding functions in many technical spheres such as: detection; observation; information collection, transfer and storage; communication; economization on energy; environmental protection; inspection and prevention of food security, traffic safety and mine safety; measure and control for aviation and space engineering, etc.

China Instrument and Control Society (CIS) & The Chinese Optical Society (COS) are National Learned Societies awarded by the China Association for Science and Technology (CAST). CIS is the authorized scholarly organization in the fields of instrument and meters, measurement and control, automation and related technology and industry, and of optics and optical engineering, etc. COS has significant advantages in optics, optoelectronics, imaging, optoelectronic information technology, optical communication, lasers, optical display, basic optics and spectroscopy. Optical technology has become an edge of discipline and affects a variety of fields.

The “International Conference and Fair for Measurement Instrumentation and Automation (MICONEX)” originated by CIS has great impact on domestic and overseas industry. CIS has been making great efforts on MICONEX for more than 20 years, and MICONEX has received around 600 manufacturers and traders coming from 21 countries and regions over the world, the exhibition area has reached 25 thousands square meters. MICONEX is held once every year, the exhibition location is Beijing or Shanghai, China, separately in turn. It is believed that the combination of OIT conference and MICONEX will obtain more perfect effects.

OIT’09 will highlight the core of optoelectronic instrument and technology. The academic topics of conference will focus on the optical system, optoelectronic instruments, optical trapping, imaging, optoelectronic measurement and optoelectronic devices, etc. OIT’09 sponsors will provide an academic intercommunion platform to communicate the newest interested science or technology for all attendees, researchers and experts from all over the world. You are warmly welcomed to participation in this event at Shanghai, China and any of your contributions to OIT’09 are greatly appreciated.

All the papers (ORAL or POSTER) admitted by OIT’09 conference will be edited and published by SPIE, and the proceedings of OIT’09 will be indexed by EI, ISI, INSPEC, AIAA or other index systems.

Date: 19-22 October 2009

Place: Shanghai Everbright International Hotel(上海光大国际大酒店)

Language: English

Critical Dates:

Abstract Due: 15 June 2009

Manuscript Due : 10 Sept. 2009

主办单位:

CIS (China Instrument and Control Society) /中国仪器仪表学会

COS (The Chinese Optical Society) /中国光学学会

SPIE (The International Society for Optical Engineering)

协办单位:

Opto-Electronic –Mechanic Technology and System Integration Chapter, CIS /中国仪器仪表学会光机电技术与系统集成分会

University of Shanghai for Science and Technology/上海理工大学

Beijing Institute of Technology/北京理工大学

Optical Instrument Chapter, CIS/中国仪器仪表学会光学仪器分会

Instrument Society of America/ 美国仪表学会

Institute of Measurement and Control/ 英国测量与控制学会

Hong Kong Institution of Engineers/ 香港工程师学会

The Society of Instrument and Control Engineers/ 日本测量与控制学会

Capital Normal Univ./首都师范大学

Hamamatsu Photonics K.K. (JAPAN)/日本浜松光子学株式会社 

Chongqing Univ./重庆大学

Tsinghua Univ./清华大学

Tianjin Univ./天津大学

Zhejiang Univ./浙江大学

Nanjing Univ./南京大学

大会主席:

Songlin Zhuang/庄松林, Shanghai Univ. of Science and Technology (China)

大会共主席: 
Yuri Chugu, New Siberia Academy of Sciences, (Russia)

Arthur Chiou, SPIE/ National Yang-Ming University (Taipei, China)

名誉主席:

Daheng Wang/王大珩 Chinese Academy of Sciences (CAS)

T.Hiruma/昼马辉夫 Hamamatsu Photonics K.K.(JAPAN)

Guoguang Mu/母国光 Nankai Univ. (China)

Bingkun Zhou/周炳琨 Tsinghua Univ. (China)

学术委员会主席:

Guofan Jin/金国藩 Tsinghua Univ. (China)

学术委员会共主席:

Yimo Zhang/张以谟 Tianjin Univ.

Sien Chi/祁甡 National Chiao Tung University (Taipei, China)

组委会主席:

Youhua Wu/吴幼华 China Instrument and Control Society

组委会共主席:

Guoqiang Ni/倪国强 Beijing Institute of Technology

Daoyin Yu/郁道银 Tianjin Univ.

Yulin Xi/席与霖 Beijing Hamamatsu Photon Techniques INC.

Zhengji Ni/倪技争 University of Shanghai for Science and Technology (China)

Jinxue Wang/王金学 SPIE (USA)

大会秘书长:

Youhua Wu/吴幼华 China Instrument and Control Society

执行秘书长:

Boyu Ding/丁伯瑜 Beijing Institute of Technology

副秘书长:

Hanquan Zhang/张汉权 China Instrument and Control Society

Xiongwen Qin/秦雄文 China Instrument and Control Society

Yuejin Zhao/赵跃进 Beijing Institute of Technology

Tiegen Liu/刘铁根 Tianjin Univ.

Qionghui Feng冯琼辉 Shanghai Univ. of Science and Technology

Cunlin Zhang张存林 Capital Normal Univ.

组委会委员:

Weimin Chen/陈伟民 Chongqing Univ.

Hongda Chen/陈弘达 Institute of Semiconductors, CAS

Yan Zhang/张岩 Capital Normal Univ.

Shangzhong Jin/金尚忠 Chinese Jiliang Univ.

Boshun Hu/胡柏顺 Modern Scientific Instruments

Libo Yuan/苑立波 Harbin Engineering University

Tian Lan/蓝天 Beijing institute of Technology

论文提交：

论文提交网站：http://www.oe-oem.org/oit  

个人信息提交：http://www.oe-oem.org/oit  

论文书写规范：http://spie.org/x570.xml  

Secretariat Contact：

Cuilingli /李翠玲 Phone & Fax: 010-68912564 Cuilingli@bit.edu.cn  

Liquan Dong /董立泉 Phone & Fax: 010-68912559-2 kylind@bit.edu.cn  

Boyu Ding /丁伯瑜 Phone & Fax: 010-82616603 Dingboyu@vip.sohu.com

Session 1

Optical Systems and Modern Optoelectronic Instruments (光学系统和现代光电仪器)

Conference Chairs:

Yunlong Sheng, Laval University (Canada)

Kimio Tatsuno, Hitachi (Japan)

Yongtian Wang, Beijing Institute of Technology (China)

Program Committee:

Jiabi Chen, University of Shanghai for Science and Technology (China)

Chunlei Du, Institute of Optics and Electronics (China)

Jia-Ruey Duann, Industrial Technology Research Institute (Taiwan, China)

Sen Han, Veeco Instruments (USA)

Qun Hao, Beijing Institute of Technology (China)

Mei-Li Hsien, National Taiwan Normal University (Taiwan, China)

Hong Hua, University of Arizona (USA)

Ken Y. Hsu, National Chiao Tung University (Taiwan, China)

Hisao Kikuta, Osaka Prefecture University (Japan)

Tsuyoshi Konishi, Osaka University (Japan)

Guoqing Li, University of Missouri (USA)

Irina Livsits, St. Petersburg State University (Russia)

Xiang Peng, Shenzhen University (China)

Jannick Rolland, University of Rochester (USA)

Han-Ping Shieh, National Chiao Tung University (Hsinchu, China)

Yeong-Shin Tarng, National Taiwan University of Science and Technology (Taiwan, China)

Din Ping Tsai, National Taiwan University (Taiwan, China)

Willi Ulrich, Carl Zeiss (Germany)

Paul Urbach, Delft University of Technology (Netherland)

Yuejin Zhao, Beijing Institute of Technology (China)

Secretary: Nan Zhu, Beijing Institute of Technology

Subtopics:

　　　　　　  Design and Application of Virtual Instruments

　　　　　　  Design and Optimization Methods for Optical Systems and Optoelectronic Instruments

　　　　　　  Diffractive Optical Systems

　　　　　　  Image Processing and its Application in Instruments

　　　　　　  Infrared Optical Systems and Instruments

　　　　　　  Instruments for Laboratories and Science Research

　　　　　　  Micro Optical Systems

　　　　　　  Novel Optical Elements and Applications

　　　　　　  Optical Displays: Systems, Devices and Materials

　　　　　　  Spectral Instruments

　　　　　　  Stray Light Analysis

　　　　　　  Subsystems and Components Design and Manufacture

　　　　　　  UV Optics and X-ray Optics

　　　　　　  Zoom Optical System

Session 2
Optical Trapping and Microscopic Imaging（光镊与显微成像）

Conference Chairs:

Xiaocong Yuan, Nankai University (China)

Yinmei Li, University of Science and Technology of China (China)

Arthur Chiou, National Yang-Ming University (Taipei, China)

Min Gu, Swinburne University of Technology (Australia)

Dennis Matthews, UC Davis (USA)

Colin Shepherd, National University of Singapore (Singapore)

Program Committee:

Zhongping Chen, University of California, Irvine (USA)

Daniel Elson, Imperial College London (UK)

Paul French, Imperial College London (UK)

Bruce Z. Gao, Clemson University (USA)

Aaron H.P. Ho, The Chinese University of Hong Kong (China)

Hui Ma, Tsinghua University (China)

H. Daniel Ou-Yang, Lehigh University (USA)

Xuanhui Lu, Zhejiang University (China)

Halina Rubinsztein-Dunlop, The University of Queensland (Australia)

Monika Ritsch-Marte, Innsburck Medical University (Australia)

Da Xing, South China Normal University (China)

Chinlon Lin, Nanyang Technological University (Singapore)

Xiaohui Zhang, Chinese Academy of Sciences (China)

Jesper Glückstad, Danmarks Tekniske University (Denmark)

Siwei Zhu, Tianjin Union Medicine Centre (China)

Secretary: Xing Zhao (Nankai University)

Optical trapping and micro- & nano-scale imaging are current “hot” topics in the field of optical science and engineering. Optical trapping offers unique non-invasive forces on micro- and nano-sized particles and biological samples for the purpose of micromanipulation, which enables diverse applications in the studies of biological cells, molecules, DNA, novel chemical synthesis and soft condense matter and hydrodynamic interactions. Novel imaging, sensing and spectroscopy techniques, on the other hand, are complementary optical methods for studying and understanding the biological samples in terms of observation and measurement. The optical trapping and imaging techniques provide significant opportunities in biomedical applications with novel ideas and enhancement. Major topics include, but are not limited to:

Subtopics:

　　　　　　  Optical trapping and manipulation

　　　　　　  Optical sorting

　　　　　　  Microfluidics

　　　　　　  Plasmonics

　　　　　　  Fundamental Concepts

　　　　　　  Novel Imaging

　　　　　　  Novel Sensing

　　　　　　  Novel spectroscopy

　　　　　　  Applications of optical trapping

　　　　　　  Optical trapping assisted systems 

Session 3
Advanced Sensor Technology and Applications (先进的传感器技术与应用)

Conference Chairs:

YanBiao Liao, Tsinghua University (China)

Anbo Wang, Virginia Polytechnic Institute and State Univ. (USA)

Tingyun Wang, Shanghai University, (China)

Yukihiro Ishii, Tokyo University of Science(Japan)

Program Committee:

Weihong Bi, Yanshan University, (China)

Rongshen Chen, The University of Birmingham (UK)

Weimin Chen, Chongqing University (China)

Zhe Chen, Jinan University (China)

Kin Seng Chiang, City University of Hong Kong (Hong Kong China)

Fajie Duan, Tianjin University (China)

Claire Gu, University of California at Santa Cruz(USA)

Shibin Jiang, NP Photonics, Inc, (USA)

Wei Jin, Hong Kong Polytechnic University (Hong Kong China)

Gan-Ding Peng, University of New South Wales (Australia)

Yunjian Rao, University of Electronic Science and Technology of China (China)

Aiguo Song, Southeast University (China)

Hai Xiao, University of Missouri, (USA)

Libo Yuan, Harbin Engineering University (China)

Secretary:

Subtopics:

　　　　　　  Physical and Mechanical Sensors

　　　　　　  Chemical, Environmental and biomedical Sensors

　　　　　　  Sensors for Electrical, Magnetic field Measurement

　　　　　　  Mutiplexing and Integration of Sensors

　　　　　　  Interferometric and Polarimetric Sensors

　　　　　　  Micro Structured Optical Fiber Sensors

　　　　　　  Optical Planar Waveguide-based Sensors

　　　　　　  Passive and Active Components for Photonic Sensing

　　　　　　  Distributed and Quasi-distributed Sensing

　　　　　　  Visual Sense Sensor

　　　　　　  Sensor Network

　　　　　　  Applications for Sensor

　　　　　　  Optical Fiber Sensors

Session 4
Optoelectronic Devices & Integration (光电器件与集成)

Conference Chairs:

Xuping Zhang, Nanjing University (China);

Wojtek J. Bock, Université du Québec en Outaouais, Qué (Canada)

Xuejun Lu, Univ. of Massachusetts/Lowell (USA)

Hai Ming, University of Science and Technology of China (China)

Program Committee:

Xiaoyi Bao, University of Ottawa( Canada)

Sien Chi, National Chiao Tung University (Taiwan, China)

Haiyong Gan, OmniVision Technologies Inc., ( USA)

Yi Li, University of Shanghai for Science and Technology (China)

Edwin Y B Pun，City University of Hong Kong（Hong Kong）

Ping Shum, Nanyang Technological University (Singapore)

Feng Song, Nankai University(China)

Suning Tang, Crystal Research, Inc. (USA)

Scott S. H. Yam, Queen’s University, Kingston, (Canada)

Jianyi Yang, Zhejiang University (China)

Jianguo Zhang, London South Bank University (UK)

Secretary: Zhaolong Li, Nanjing University (China)

Subtopics:

　　　　　　  Physics and Simulation of Optoelectronic and Photonic Crystal Fiber Devices

　　　　　　  Photonic Crystal Fiber and Photonic Crystal Fiber Based Devices

　　　　　　  Fiber Amplifiers and Lasers

　　　　　　  Polarization Maintained / Scrambled Lasers

　　　　　　  Semiconductor Photoelectronics

　　　　　　  Micro-Optics and Photoic Inter-connectors

　　　　　　  Multifunctional Components and Arrayed Devices

　　　　　　  Terahertz and Gigahertz Electronics and Photonics

　　　　　　  High-power fiber laser

　　　　　　  Emerging Optoelectronic Applications

　　　　　　  Optoelectronic Hybrid and Monolithic Integration

　　　　　　  Integrated Optics and Photonic Integrated Circuits

　　　　　　  Advanced Micro Optoelectronic Devices

　　　　　　  Photonics Materials and Devices

　　　　　　  Surface Plasmon Nanolithography, Plasmonic Waveguided and Devices

　　　　　　  Fibre Grating and Its Applications

　　　　　　  Integrated optics

　　　　　　  Optical switcher, connector, modulator and other active and passive devices

　　　　　　  Waveguide devices

Session 5
MEMS/NEMS Technology and Applications (微纳机电技术与应用)

Conference Chairs:

Zhaoying Zhou, Tsinghua Univ. (China)

Helmut Seidel, Microfluidics/Microactuators, Saarland University (Germany)

XinXin Li, Shanghai Institute of microsystem and information technology, CAS (China)

Toshio Fukuda, Nagoya University (Japan)

Wen J. Li, The Chinese University of Hong Kong (China)

Xiaoning Jiang, TRS Technologies, USA (USA)

Program Committee:

Shuo-Hung Chang, National Taiwan University (Taiwani, China)

Longsheng Fan, Cellular and Molecular BioMEMS Laboratory, NTHU (China)

Hong Hocheng, National Tsinghua University (Taiwani, China)

Roger T. Howe, Department of Electrical Engineering, Stanford University (USA)

Wen J. Li, The Chinese University of Hong Kong (China)

Liwei Lin, University of California at Berkeley (USA)

Aiqun Liu, Nanyang Technological University (Singapore)

Sixing Liu, Bandag Incorporated (USA)

Zhichun Ma, Ford Motor Company (USA)

Isao Shimoyama, School of Information Science and Technology, University of Tokyo (Japan)

Man WONG, The Hong Kong University of Science & Technology (China)

Wengang Wu，Peking University (China)

Xing Yang, Tsinghua University (China)

Yang Zhao，President & CEO. MEMSIC Inc.(China)

Secretary:

Subtopics:

　　　　　　  Innovative Concept, Mechanism & Phenomenon in MEMS/NEMS

　　　　　　  Micro Sensors & Micro Actuators

　　　　　　  Inertial-MEMS and Applications

　　　　　　  Optical-MEMS, Micro-optics, Micro Optical-electro Elements and Applications

　　　　　　  Bio-MEMS, Chemical MEMS and Applications

　　　　　　  RF MEMS, Remote Sensing Technology and Instruments

　　　　　　  Micro-fluidics, Devices, Instruments

　　　　　　  MEMS/NEMS Fabrication and Foundry

　　　　　　  Nano-device, NEMS and Nanotechnology

　　　　　　  Applications for MEMS/NEMS Technology & System Integration

　　　　　　  Others (Including MEMS /NEMS Design, Test, Packaging, Reliability, etc.)

Session 6

Optoelectronic Measurement Technology and System(光电测试技术与系统)

Conference Chairs:

Shenghua Ye, Tianjin Univ. (China)

Guangjun Zhang, Beijing Univ. of Aeronautics & Astronautics (China)

Jun Ni University of Michigan (USA)

Program Committee:

Kexin Xu, Tianjin Univ. (China)

Changku Sun, Tianjin Univ. (China)

Dingguo Sha, Beijin Institute of Technology, (China)

Shangzhong Jin, China Jiliang Univ. (China)

Bukem Bilen, Bogazici University（Turkey）

Osami Sasaki , Niigata Univ (Japan)

Takamasa Suzuki, Niigata Univ (Japan)

Jiubin Tan, Harbin Institute of Technology, (China)

Qibo Feng, Beijing Jiaotong Univ. (China)

Jigui Zhu, Tianjin Univ. (China)

Secretary:

Subtopics:

　　　　　　  Optoelectronic Measurement in Metrology

　　　　　　  Optoelectronic Measurement in Manufacturing Industry

　　　　　　  Optoelectronic Measurement in Process of Production

　　　　　　  Optoelectronic Measurement in Agriculture, Chemical and Environment

　　　　　　  Optoelectronic Measurement in Biology and Medicine

　　　　　　  Optoelectronic Measurement in Aerospace

　　　　　　  Optoelectronic Measurement in Control and Virtual Reality

　　　　　　  Optoelectronic Measurement in safety and Diagnosis

　　　　　　  Optoelectronic Measurement in Mechanical Capacity and Electronical Capacity

　　　　　　  Optoelectronic Measurement in Energy and Transportation

　　　　　　  Optoelectronic Measurement in Architecture and Engineering Structure

Session 7

Opto-electronic information security (光电信息安全)

Conference Chairs:

Cunlin Zhang, Capital Normal University (China)

Tiegen Liu, Tianjin University (China)

Daniel Grischkowsky, Oklahoma State University (USA)

Program Committee:

Pierre Chavel, National Committee for Scientific Research (France)

Hou-Tong Chen, Los Alamos National Lab, USA（USA）

Xiang Peng, Shenzhen University (China)

Daxiong Xu, Beijing University of Posts and Telecommunications (China)

Chongxiu Yu, Beijing University of Posts and Telecommunications (China)

Hongchen Zhai, Tianjin University (China)

Dawei Zhang, University of Shanghai for Science and Technology (China)

Jingjuan Zhang, Graduate University of Chinese Academy of Sciences (China)

Secretary:

In the field of information security, opto-electronic technology and instrumentation is a promising approach. It includes not only traditional research topics, such as laser holography an-ticounterfaking, opto-electornic secure identification and verification, opto-electronic informati-on security devices and systems, but emerging ones such as THz radiation offers the opportunity for transformational advances in defense and security, opto-electronic information embedding and coding, opto-electronic devices in biometric recognition. This symposium is believed to contribute to the development of opto-electronic technology in information security, the security of financial circulation and furthermore to the tackling of global financial crisis.

Subtopics:

　　　　　　  THz technology in security and defense

　　　　　　  Laser holography anticounterfaking

　　　　　　  Opto-electronic information embedding and coding

　　　　　　  Opto-electornic secure identification and verification

　　　　　　  Opto-electronic technology and instrumentation in biometric recognition

　　　　　　  Opto-electronic information security devices and systems

Session 8

Opto-electronic Imaging and Processing Technology（光电成像与处理技术）

Conference Chairs：

Toru Yoshizawa，Saitama Medical University（Japan）

Ping Wei，Beijing Institute of Technology（China）

Jesse Zheng，Photontech Instruments Corp.（Canada）

Program Committee：

Tingzhu Bai，Beijing Institute of Technology（China）

Ruowei Gu，Opton Co.,Ltd.（Japan）

Tangjun Li，Beijing Jiao tong University（China）

Peilin Liu，Shanghai Jiao tong University（China）

Yinglong Liu，Central South University（China）

Cunwei Lu，Fukuoka Institute of Technology（Japan）

Tsutomu Shimura，The University of Tokyo（Japan）

Xiaodi Tan，Sony Corp.（Japan）

Pingtao Wang，O&E Co.,Ltd.（Japan）

Shengli Wu，Xi’an Jiao tong University（China）

Jingyun Zhang，Areo-creative Corp.（USA）

Secretary：Lingxue Wang，Beijing Institute of Technology（China）

Subtopics：

Topics of interest include all aspects of Opto-electronic Imaging and Processing Technology, but are not limited to, the following areas:

　　　　　　  Image sensors and applications

　　　　　　  Intelligent/smart cameras and applications

　　　　　　  High-resolution and high-speed cameras and applications

　　　　　　  Image processing algorithms and systems

　　　　　　  Machine vision methods, architectures and applications

　　　　　　  Three-dimensional profilometry by structured light, interferometry and Advancement in Shape-from-X methods

Multi-spectral Imaging

Performance Evaluation

Object Detection and Recognition

Optical Corelation

Optical Information Storage

Digital Hologram/Image

Imaging techniques for manufacturing

Imaging techniques for security

Imaging techniques for ITS

Imaging techniques for Aerial Survey

Imaging techniques for Environment

Imaging for nursing care and welfare

Imaging for medical and biomedical applications

Diagnostic imaging by ultra-sonics, PET, MRI, X-ray CT